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	Investigation of passivation layer of CdZnTe detector
	Lu, Yue[1]; Sang, Wen-Bin[2]; Xia, Jun[3]; Min, Jia-Hua[4]; Qian, Yong-Biao[5]; Teng, Jian-Yong[6]
	2007
会议名称	ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology
会议日期	2006-10-23
页码	962-964
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2384722
专题	上海大学
作者单位	[1]School of Material Science and Engineering, Shanghai University, Shanghai 200072, China[2]School of Material Science and Engineering, Shanghai University, Shanghai 200072, China[3]School of Material Science and Engineering, Shanghai University, Shanghai 200072, China[4]School of Material Science and Engineering, Shanghai University, Shanghai 200072, China[5]School of Material Science and Engineering, Shanghai University, Shanghai 200072, China[6]School of Material Science and Engineering, Shanghai University, Shanghai 200072, China
推荐引用方式 GB/T 7714	Lu, Yue[1],Sang, Wen-Bin[2],Xia, Jun[3],et al. Investigation of passivation layer of CdZnTe detector[C]. 见:ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology. 2006-10-23.

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