Investigation of the reverse recovery characteristics of vertical bulk GaN-based Schottky rectifiers

	Investigation of the reverse recovery characteristics of vertical bulk GaN-based Schottky rectifiers
	Gu, Hong(顾泓); Zhang, Zhiqiang(张志强); Zhou, Taofei(周桃飞); Xu, Ke(徐科); Tian, Feifei(田飞飞); Liu, Lei(刘磊); Wang, Jianfeng(王建峰)
刊名	JOURNAL OF PHYSICS D-APPLIED PHYSICS
	2018
其他题名	Investigation of the reverse recovery characteristics of vertical bulk GaN-based Schottky rectifiers
语种	英语
内容类型	期刊论文
源URL	[http://ir.sinano.ac.cn/handle/332007/6144]
专题	苏州纳米技术与纳米仿生研究所_测试分析平台
作者单位	中国科学院苏州纳米技术与纳米仿生研究所
推荐引用方式 GB/T 7714	Gu, Hong,Zhang, Zhiqiang,Zhou, Taofei,et al. Investigation of the reverse recovery characteristics of vertical bulk GaN-based Schottky rectifiers[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2018.
APA	Gu, Hong.,Zhang, Zhiqiang.,Zhou, Taofei.,Xu, Ke.,Tian, Feifei.,...&Wang, Jianfeng.(2018).Investigation of the reverse recovery characteristics of vertical bulk GaN-based Schottky rectifiers.JOURNAL OF PHYSICS D-APPLIED PHYSICS.
MLA	Gu, Hong,et al."Investigation of the reverse recovery characteristics of vertical bulk GaN-based Schottky rectifiers".JOURNAL OF PHYSICS D-APPLIED PHYSICS (2018).