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	Migration of grain boundaries and triple junctions in high-purity aluminum during annealing after slight cold rolling
	Yin, Wenhong[1]; Wang, Weiguo[2]; Fang, Xiaoying[3]; Qin, Congxiang[4]; Xing, Xiaoguang[5]
刊名	MATERIALS CHARACTERIZATION
	2015
卷号	107页码:134-138
关键词	Aluminum EBSD Microstructure Triple junctions Grain boundaries
ISSN号	1044-5803
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2266761
专题	上海大学
作者单位	1.[1]Shanghai Univ, Inst Mat, Shanghai 200072, Peoples R China. 2.Shandong Univ Technol, Sch Mech Engn, Zibo 255049, Peoples R China. 3.[2]Shanghai Univ, Inst Mat, Shanghai 200072, Peoples R China. 4.Fujian Univ Technol, Sch Mat Sci & Engn, Fuzhou 350118, Peoples R China. 5.[3]Shandong Univ Technol, Sch Mech Engn, Zibo 255049, Peoples R China. 6.[4]Shanghai Univ, Inst Mat, Shanghai 200072, Peoples R China. 7.Shandong Univ Technol, Sch Mech Engn, Zibo 255049, Peoples R China. 8.[5]Shandong Univ Technol, Sch Mech Engn, Zibo 255049, Peoples R China.
推荐引用方式 GB/T 7714	Yin, Wenhong[1],Wang, Weiguo[2],Fang, Xiaoying[3],et al. Migration of grain boundaries and triple junctions in high-purity aluminum during annealing after slight cold rolling[J]. MATERIALS CHARACTERIZATION,2015,107:134-138.
APA	Yin, Wenhong[1],Wang, Weiguo[2],Fang, Xiaoying[3],Qin, Congxiang[4],&Xing, Xiaoguang[5].(2015).Migration of grain boundaries and triple junctions in high-purity aluminum during annealing after slight cold rolling.MATERIALS CHARACTERIZATION,107,134-138.
MLA	Yin, Wenhong[1],et al."Migration of grain boundaries and triple junctions in high-purity aluminum during annealing after slight cold rolling".MATERIALS CHARACTERIZATION 107(2015):134-138.

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