Alignment error analysis of detector array for spatial heterodyne spectrometer | |
Jin, Wei1,2,3; Chen, Di-Hu1,3; Li, Zhi-Wei1,3; Luo, Hai-Yan1,3; Hong, Jin1,3 | |
刊名 | APPLIED OPTICS |
2017-12-10 | |
卷号 | 56期号:35页码:9830-9836 |
ISSN号 | 1559-128X |
DOI | 10.1364/AO.56.009830 |
英文摘要 | Spatial heterodyne spectroscopy (SHS) is a new spatial interference spectroscopy which can achieve high spectral resolution. The alignment error of the detector array can lead to a significant influence with the spectral resolution of a SHS system. Theoretical models for analyzing the alignment errors which are divided into three kinds are presented in this paper. Based on these models, the tolerance angle of these errors has been given, respectively. The result of simulation experiments shows that when the angle of slope error, tilt error, and rotation error are less than 1.21 degrees, 1.21 degrees, 0.066 degrees respectively, the alignment reaches an acceptable level. (C) 2017 Optical Society of America |
资助项目 | National Natural Science Foundation of China (NSFC)[41605014] |
WOS关键词 | SPECTROSCOPY ; DASH |
WOS研究方向 | Optics |
语种 | 英语 |
出版者 | OPTICAL SOC AMER |
WOS记录号 | WOS:000417553500029 |
内容类型 | 期刊论文 |
源URL | [http://ir.hfcas.ac.cn:8080/handle/334002/35024] |
专题 | 合肥物质科学研究院_中科院安徽光学精密机械研究所 |
通讯作者 | Chen, Di-Hu |
作者单位 | 1.Chinese Acad Sci, Hefei Inst Phys Sci, Anhui Inst Opt & Fine Mech, Hefei 230031, Anhui, Peoples R China 2.Univ Sci & Technol China, Hefei 230026, Anhui, Peoples R China 3.Chinese Acad Sci, Key Lab Opt Calibrat & Characterizat, Hefei 230031, Anhui, Peoples R China |
推荐引用方式 GB/T 7714 | Jin, Wei,Chen, Di-Hu,Li, Zhi-Wei,et al. Alignment error analysis of detector array for spatial heterodyne spectrometer[J]. APPLIED OPTICS,2017,56(35):9830-9836. |
APA | Jin, Wei,Chen, Di-Hu,Li, Zhi-Wei,Luo, Hai-Yan,&Hong, Jin.(2017).Alignment error analysis of detector array for spatial heterodyne spectrometer.APPLIED OPTICS,56(35),9830-9836. |
MLA | Jin, Wei,et al."Alignment error analysis of detector array for spatial heterodyne spectrometer".APPLIED OPTICS 56.35(2017):9830-9836. |
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