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	Numerical Analysis on RHEED Patterns Based on Gray Level: a Case Study of IBAD-MgO Film
	Shi, Xiao Liang[1]; Fan, Feng[2]; Guo, Yan Qun[3]; Bai, Chuan Yi[4]; Lu, Yu Ming[5]; Liu, Zhi Yong[6]; Cai, Chuan Bing[7]
	2015
会议名称	IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD)
会议日期	2015-01-01
关键词	RHEED pattern analysis method biaxially textured IBAD-MgO
页码	458-459
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/2240375
专题	上海大学
作者单位	1.[1]Shanghai Univ, Dept Phys, Shanghai Key Lab High Temp Superconductors, Shanghai 200444, Peoples R China. 2.[2]Shanghai Univ, Dept Phys, Shanghai Key Lab High Temp Superconductors, Shanghai 200444, Peoples R China. 3.Shanghai Creat Superconductor Technol Co Ltd, Shanghai 201401, Peoples R China. 4.[3]Shanghai Univ, Dept Phys, Shanghai Key Lab High Temp Superconductors, Shanghai 200444, Peoples R China. 5.Shanghai Creat Superconductor Technol Co Ltd, Shanghai 201401, Peoples R China. 6.[4]Shanghai Univ, Dept Phys, Shanghai Key Lab High Temp Superconductors, Shanghai 200444, Peoples R China. 7.Shanghai Creat Superconductor Technol Co Ltd, Shanghai 201401, Peoples R China. 8.[5]Shanghai Univ, Dept Phys, Shanghai Key Lab High Temp Superconductors, Shanghai 200444, Peoples R China. 9.Shanghai Creat Superconductor Technol Co Ltd, Shanghai 201401, Peoples R China. 10.[6]Shanghai Univ, Dept Phys, Shanghai Key Lab High Temp Superconductors, Shanghai 200444, Peoples R China.
推荐引用方式 GB/T 7714	Shi, Xiao Liang[1],Fan, Feng[2],Guo, Yan Qun[3],et al. Numerical Analysis on RHEED Patterns Based on Gray Level: a Case Study of IBAD-MgO Film[C]. 见:IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD). 2015-01-01.

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