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Enhanced CMOS image sensor by flexible 3D nanocone anti-reflection film
Tian, Li[1]; Luo, Xiaolei[2]; Yin, Min[3]; Li, Dongdong[4]; Xue, Xinzhong[5]; Wang, Hui[6]
刊名SCIENCE BULLETIN
2017
卷号62页码:130-135
关键词CMOS image sensor Nancone anti-reflection film Quantum efficiency Digital data value Root-mean-square contrast
ISSN号2095-9273
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2193197
专题上海大学
作者单位[1]Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai, 201210, China [2]Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai, 201210, China |School of Environmental and Chemical Engineering, Shanghai University, Shanghai, 200444, China[3]Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai, 201210, China [4]Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai, 201210, China [5]Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai, 201210, China [6]Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai, 201210, China
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GB/T 7714
Tian, Li[1],Luo, Xiaolei[2],Yin, Min[3],et al. Enhanced CMOS image sensor by flexible 3D nanocone anti-reflection film[J]. SCIENCE BULLETIN,2017,62:130-135.
APA Tian, Li[1],Luo, Xiaolei[2],Yin, Min[3],Li, Dongdong[4],Xue, Xinzhong[5],&Wang, Hui[6].(2017).Enhanced CMOS image sensor by flexible 3D nanocone anti-reflection film.SCIENCE BULLETIN,62,130-135.
MLA Tian, Li[1],et al."Enhanced CMOS image sensor by flexible 3D nanocone anti-reflection film".SCIENCE BULLETIN 62(2017):130-135.
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