| Fringe projection profilometry based on the best phase sensitivities | |
| Zhang, Ruihua[1]; Guo, Hongwei[2] | |
| 2017 | |
| 会议名称 | 2nd International Conference on Photonics and Optical Engineering (icPOE) |
| 会议日期 | 2016-10-14 |
| 关键词 | Instrumentation measurement and metrology Surface measurements figure Fringe analysis Phase measurement Calibration |
| URL标识 | 查看原文 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/2190798 |
| 专题 | 上海大学 |
| 作者单位 | 1.[1]Nantong Vocat Univ, Sch Mech Engn, Nantong 226007, Jiangsu, Peoples R China. 2.Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai 200072, Peoples R China. 3.[2]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai 200072, Peoples R China. |
| 推荐引用方式 GB/T 7714 | Zhang, Ruihua[1],Guo, Hongwei[2]. Fringe projection profilometry based on the best phase sensitivities[C]. 见:2nd International Conference on Photonics and Optical Engineering (icPOE). 2016-10-14. |
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