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	Data-Driven Distributed Local Fault Detection for Large-Scale Processes Based on the GA-Regularized Canonical Correlation Analysis
	Jiang, Qingchao[1]; Ding, Steven X.[2]; Wang, Yang[3]; Yan, Xuefeng[4]
刊名	IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
	2017
卷号	64页码:8148-8157
关键词	Canonical correlation analysis (CCA) distributed fault detection genetic algorithm (GA) large-scale processes
ISSN号	0278-0046
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2184559
专题	上海大学
作者单位	1.[1]East China Univ Sci & Technol, Minist Educ, Key Lab Adv Control & Optimizat Chem Proc, Shanghai 200237, Peoples R China. 2.Univ Duisburg Essen, Inst Automat Control & Complex Syst AKS, D-47057 Duisburg, Germany. 3.[2]Univ Duisburg Essen, Inst Automat Control & Complex Syst, D-47057 Duisburg, Germany. 4.[3]Shanghai Dianji Univ, Sch Elect Engn, Shanghai 200240, Peoples R China.,Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai 200072, Peoples R China. 5.[4]East China Univ Sci & Technol, Minist Educ, Key Lab Adv Control & Optimizat Chem Proc, Shanghai 200237, Peoples R China.
推荐引用方式 GB/T 7714	Jiang, Qingchao[1],Ding, Steven X.[2],Wang, Yang[3],et al. Data-Driven Distributed Local Fault Detection for Large-Scale Processes Based on the GA-Regularized Canonical Correlation Analysis[J]. IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS,2017,64:8148-8157.
APA	Jiang, Qingchao[1],Ding, Steven X.[2],Wang, Yang[3],&Yan, Xuefeng[4].(2017).Data-Driven Distributed Local Fault Detection for Large-Scale Processes Based on the GA-Regularized Canonical Correlation Analysis.IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS,64,8148-8157.
MLA	Jiang, Qingchao[1],et al."Data-Driven Distributed Local Fault Detection for Large-Scale Processes Based on the GA-Regularized Canonical Correlation Analysis".IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS 64(2017):8148-8157.

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