Atomic Layer Deposited ZrxAl1-xOy Film as High Gate Insulator for High Performance ZnSnO Thin Film Transistor | |
Li, Jun[1]; Zhou, You-Hang[2]; Zhong, De-Yao[3]; Huang, Chuan-Xin[4]; Huang, Jian[5]; Zhang, Jian-Hua[6] | |
刊名 | ELECTRONIC MATERIALS LETTERS |
2018 | |
卷号 | 14页码:669-677 |
关键词 | Atomic layer deposition ZrxAl1-xOy thin films ZTO TFTs NBIS stability TS stability |
ISSN号 | 1738-8090 |
URL标识 | 查看原文 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2171878 |
专题 | 上海大学 |
作者单位 | 1.[1]Shanghai Univ, Sch Mat Sci & Engn, Shanghai 201800, Peoples R China. 2.Shanghai Univ, Minist Educ, Key Lab Adv Display & Syst Applicat, Shanghai 200072, Peoples R China. 3.[2]Shanghai Univ, Sch Mat Sci & Engn, Shanghai 201800, Peoples R China. 4.[3]Shanghai Univ, Sch Mat Sci & Engn, Shanghai 201800, Peoples R China. 5.Shanghai Univ, Minist Educ, Key Lab Adv Display & Syst Applicat, Shanghai 200072, Peoples R China. 6.[4]Shanghai Univ, Sch Mat Sci & Engn, Shanghai 201800, Peoples R China. 7.[5]Shanghai Univ, Sch Mat Sci & Engn, Shanghai 201800, Peoples R China. 8.[6]Shanghai Univ, Minist Educ, Key Lab Adv Display & Syst Applicat, Shanghai 200072, Peoples R China. |
推荐引用方式 GB/T 7714 | Li, Jun[1],Zhou, You-Hang[2],Zhong, De-Yao[3],et al. Atomic Layer Deposited ZrxAl1-xOy Film as High Gate Insulator for High Performance ZnSnO Thin Film Transistor[J]. ELECTRONIC MATERIALS LETTERS,2018,14:669-677. |
APA | Li, Jun[1],Zhou, You-Hang[2],Zhong, De-Yao[3],Huang, Chuan-Xin[4],Huang, Jian[5],&Zhang, Jian-Hua[6].(2018).Atomic Layer Deposited ZrxAl1-xOy Film as High Gate Insulator for High Performance ZnSnO Thin Film Transistor.ELECTRONIC MATERIALS LETTERS,14,669-677. |
MLA | Li, Jun[1],et al."Atomic Layer Deposited ZrxAl1-xOy Film as High Gate Insulator for High Performance ZnSnO Thin Film Transistor".ELECTRONIC MATERIALS LETTERS 14(2018):669-677. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论