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	A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application
	Jie Cui; Xiangsheng Fang; Jiliang Zhang; Maoxiang Yi; Zhengfeng Huang; Aibin Yan; Xiaoqing Wen; Kang Yang
刊名	IEEE Transactions on Circuits and Systems II: Express Briefs
	2018
页码	1
关键词	Latches Radiation hardening Clocks Feedback loop Power dissipation Reliability Electronic mail Circuit reliability radiation hardening soft error double-node upset single node upset.
ISSN号	1549-7747;1558-3791
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2156573
专题	安徽大学
作者单位	1.School of Computer Science and Technology, Anhui University, Hefei 230601, China 2.School of Electronic Science & 3.Department of Creative Informatics, and the Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology, Fukuoka 8208502, Japan 4.College of Computer Science and Electronic Engineering, Hunan University, Changsha 410082, China 5.Applied Physics, Hefei University of Technology, Hefei 230009, China
推荐引用方式 GB/T 7714	Jie Cui,Xiangsheng Fang,Jiliang Zhang,et al. A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application[J]. IEEE Transactions on Circuits and Systems II: Express Briefs,2018:1.
APA	Jie Cui.,Xiangsheng Fang.,Jiliang Zhang.,Maoxiang Yi.,Zhengfeng Huang.,...&Kang Yang.(2018).A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application.IEEE Transactions on Circuits and Systems II: Express Briefs,1.
MLA	Jie Cui,et al."A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application".IEEE Transactions on Circuits and Systems II: Express Briefs (2018):1.

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