A New Op-amp Noise Model for Switched-Capacitor Sigma-Delta Modulator in SIMULINK (CPCI-S收录) | |
Wu, F.[1,2]; Chen, Z. J.[2]; Zhao, M.[2]; Xu, D. Y.[1,2]; Shen, G. C.[1,2]; Lu, W. G.[2]; Zhang, Y. C.[2] | |
会议名称 | 2014 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC) |
关键词 | sigma delta modulators correlated double sampling non-ideality op-amp noise SIMULINK |
URL标识 | 查看原文 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2045388 |
专题 | 华南理工大学 |
作者单位 | 1.[1]Peking Univ, Shenzhen Grad Sch, Sch Elect & Comp Engn, Shenzhen 518055, Peoples R China 2.[2]Peking Univ, Dept Microelect, Key Lab Microelect Devices & Circuit, Beijing 100871, Peoples R China |
推荐引用方式 GB/T 7714 | Wu, F.[1,2],Chen, Z. J.[2],Zhao, M.[2],等. A New Op-amp Noise Model for Switched-Capacitor Sigma-Delta Modulator in SIMULINK (CPCI-S收录)[C]. 见:2014 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC). |
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