Study of Total-Ionizing-Dose Effects on a Single-Event-Hardened Phase-Locked Loop

doi:10.1109/TNS.2018.2812806

	Study of Total-Ionizing-Dose Effects on a Single-Event-Hardened Phase-Locked Loop
	Chen, Zhuojun ; Ding, Ding 1; Dong, Yemin 2; Shan, Yi 2; Zhou, Shuxing 3; Hu, Yuanyuan ; Zheng, Yunlong 2; Peng, Chao 4; Chen, Rongmei 5
刊名	IEEE TRANSACTIONS ON NUCLEAR SCIENCE
	2018
卷号	65 期号:4 页码:997
关键词	Phase-locked loop (PLL) phase noise reference spur total ionizing dose (TID)
ISSN号	0018-9499
DOI	10.1109/TNS.2018.2812806
英文摘要	The sensitivity of total-ionizing-dose (TID) response on a single-event hardened phase-locked loop (PLL) fabricated in a 130-nm silicon-on-insulator process is investigated. Based on the study of device parameter degradation under radiation exposure, the changes of dc and RF performance of the PLL have been presented. TID experiments on the PLL show that the power-down current increases by 1.5 times, and the tuning range drops by 11.5%. At 600 MHz and up to 500 krad(Si), the integrated phase noise increases by 29.2%, and the reference spur increases by 3.4 dB. Finally, the mechanism underlying impact of TID on the phase noise and reference spur has been discussed comprehensively, which combined measured observations with circuit modeling and simulations.
学科主题	Engineering, Electrical & Electronic ; Nuclear Science & Technology
出版者	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
WOS记录号	WOS:000429967200004
资助机构	This work was supported in part by the Fundamental Research Funds for the Central Universities under Grant 2014YJS137, in part by the Key Research Program of the Chinese Academy of Sciences under Grant KGFZD-135-16-015, in part by the CAS Pioneer Hundred Talents Program, and in part by the National Nature Science Foundation of China under Grant 61704031. ; This work was supported in part by the Fundamental Research Funds for the Central Universities under Grant 2014YJS137, in part by the Key Research Program of the Chinese Academy of Sciences under Grant KGFZD-135-16-015, in part by the CAS Pioneer Hundred Talents Program, and in part by the National Nature Science Foundation of China under Grant 61704031.
内容类型	期刊论文
源URL	[http://ir.sic.ac.cn/handle/331005/25040]
专题	中国科学院上海硅酸盐研究所
作者单位	1.Hunan Univ, Sch Phys & Elect, Minist Educ, Key Lab Micronano Optoelect Devices, Changsha 410082, Hunan, Peoples R China 2.Chinese Acad Sci, Shanghai Inst Ceram, Key Lab Inorgan Coating Mat, Shanghai 200050, Peoples R China 3.Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China 4.Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Key Lab Funct Mat & Devices Special Environm, Urumqi 830011, Peoples R China 5.China Elect Product Reliabil & Environm Testing R, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Guangdong, Peoples R China 6.Tsinghua Univ, Key Lab Particle & Radiat Imaging, Minist Educ, Dept Engn Phys, Beijing 100084, Peoples R China
推荐引用方式 GB/T 7714	Chen, Zhuojun,Ding, Ding,Dong, Yemin,et al. Study of Total-Ionizing-Dose Effects on a Single-Event-Hardened Phase-Locked Loop[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE,2018,65(4):997, 1004.
APA	Chen, Zhuojun.,Ding, Ding.,Dong, Yemin.,Shan, Yi.,Zhou, Shuxing.,...&Chen, Rongmei.(2018).Study of Total-Ionizing-Dose Effects on a Single-Event-Hardened Phase-Locked Loop.IEEE TRANSACTIONS ON NUCLEAR SCIENCE,65(4),997.
MLA	Chen, Zhuojun,et al."Study of Total-Ionizing-Dose Effects on a Single-Event-Hardened Phase-Locked Loop".IEEE TRANSACTIONS ON NUCLEAR SCIENCE 65.4(2018):997.