Internal multiple removal and its application by wavepath migration

	Internal multiple removal and its application by wavepath migration
	Liu Yi-Ke 1; Chang Xu 1; Wang Hui 1; Lu Meng-Xia 2; Sun, Hongchuan 3
刊名	CHINESE JOURNAL OF GEOPHYSICS-CHINESE EDITION
	2008-03-01
卷号	51 期号:2 页码:589-595
关键词	internal multiple multiple removal wavepath migration
ISSN号	0001-5733
文献子类	Article
英文摘要	Internal multiple removal is a great challenge in seismic processing, and there is no successful approach to remove internal multiple. We present a method to remove Internal multiple by discriminating primary reflections front multiple reflections during the migration process. Both the take-off and incidence angles are computed from the data so that rays can be traced from both the source and the receiver positions. An Eikonal equation is used for estimating the travel time table. Numerical results for a SEG/EAGE salt model show that the wavepath migration can clearly resolve the true interfaces and effectively remove multiple. Field data results show that the method can effectively remove the migration artifacts generated by internal multiples
WOS关键词	SCATTERING
WOS研究方向	Geochemistry & Geophysics
语种	英语
出版者	SCIENCE CHINA PRESS
WOS记录号	WOS:000254422000032
内容类型	期刊论文
源URL	[http://ir.iggcas.ac.cn/handle/132A11/69032]
专题	中国科学院地质与地球物理研究所
通讯作者	Liu Yi-Ke
作者单位	1.Chinese Acad Sci, Inst Geol & Geophys, Beijing 100029, Peoples R China 2.Beijing Union Univ, Beijing 100101, Peoples R China 3.Univ Utah, Inst Geol & Geophys, Salt Lake City, UT 84112 USA
推荐引用方式 GB/T 7714	Liu Yi-Ke,Chang Xu,Wang Hui,et al. Internal multiple removal and its application by wavepath migration[J]. CHINESE JOURNAL OF GEOPHYSICS-CHINESE EDITION,2008,51(2):589-595.
APA	Liu Yi-Ke,Chang Xu,Wang Hui,Lu Meng-Xia,&Sun, Hongchuan.(2008).Internal multiple removal and its application by wavepath migration.CHINESE JOURNAL OF GEOPHYSICS-CHINESE EDITION,51(2),589-595.
MLA	Liu Yi-Ke,et al."Internal multiple removal and its application by wavepath migration".CHINESE JOURNAL OF GEOPHYSICS-CHINESE EDITION 51.2(2008):589-595.