Structural evolution of axial intensity distribution during hot image formation
Zhu, Jianqiang; You, Kewei; Zhang, Yanli; Zhang, Xuejie; Sun, Mingying
刊名Appl. Optics
2017
卷号56期号:16页码:4835
通讯作者jqzhu@siom.ac.cn
英文摘要The structural evolution of the axial intensity distribution during hot image formation perturbed by a small circular optical obscuration is investigated in detail under different conditions. An analytic expression is derived for the axial intensity distribution around the conjugate plane by assuming the thickness of the nonlinear medium to be infinitely small. In view of the analysis of the axial intensity oscillation, the expression can be extensively utilized to characterize the intensity maxima for a nonlinear medium with a finite thickness. The nonlinear medium thickness and obscuration size both have great influence on the magnitudes and distributed features of the intensity maxima, which initially vary from multiple ones with comparable intensities to ultimately a maximum of one obviously remaining. The reason for this phenomenon is that the nonlinear medium acts like a low-pass filter to the scattering field, and optical interference exists between the scattering and background field. Furthermore, a fixed expression of nonlinear medium thickness and obscuration size is obtained to determine the dividing point of the alterations of the hot image intensity distribution. (C) 2017 Optical Society of America
收录类别SCI
WOS记录号WOS:000402579600038
内容类型期刊论文
源URL[http://ir.siom.ac.cn/handle/181231/27913]  
专题上海光学精密机械研究所_高功率激光物理国家实验室
作者单位中国科学院上海光学精密机械研究所
推荐引用方式
GB/T 7714
Zhu, Jianqiang,You, Kewei,Zhang, Yanli,et al. Structural evolution of axial intensity distribution during hot image formation[J]. Appl. Optics,2017,56(16):4835.
APA Zhu, Jianqiang,You, Kewei,Zhang, Yanli,Zhang, Xuejie,&Sun, Mingying.(2017).Structural evolution of axial intensity distribution during hot image formation.Appl. Optics,56(16),4835.
MLA Zhu, Jianqiang,et al."Structural evolution of axial intensity distribution during hot image formation".Appl. Optics 56.16(2017):4835.
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