Reliability Study of Grating Coupled Semiconductor Laser Based on Raman Spectra Technique

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	Reliability Study of Grating Coupled Semiconductor Laser Based on Raman Spectra Technique
	Jia, P.; L. Qin; X. Zhang; J. Zhang; T. Y. Liu; Z. W. Men and Y. Q. Ning
刊名	Spectroscopy and Spectral Analysis
	2016
卷号	36 期号:6
英文摘要	Single-longitudinal-mode end-emitting laser with 10 periods of metal slots at around 956 nm has been fabricated. 100 Lim wide broad-stripe and ten periods of 9.5 Lim periodicity metal slots are defined by i-line lithography and dry etching. Experimentally, continuous-wave power of 213 mW has achieved, at a slope efficiency of 520 mW/A, having a 3 dB spectrum width of less than 0.04 nm at 900 mA, and operating in a stable single longitudinal mode with the side-mode suppression ratio (SMSR) of 42 dB. We prove that metal slots introduce sufficient loss into the cavity to filter out the wanted mode, and is more efficient on our chip structure than traditional slot laser. This paper provides a new method for the realizing high power broad-stripe (similar to 100 mu m) laser and array with single longitudinal mode operation. (C) 2015 Elsevier B.V. All rights reserved.
收录类别	SCI ; EI
语种	中文
内容类型	期刊论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/56980]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出
推荐引用方式 GB/T 7714	Jia, P.,L. Qin,X. Zhang,et al. Reliability Study of Grating Coupled Semiconductor Laser Based on Raman Spectra Technique[J]. Spectroscopy and Spectral Analysis,2016,36(6).
APA	Jia, P.,L. Qin,X. Zhang,J. Zhang,T. Y. Liu,&Z. W. Men and Y. Q. Ning.(2016).Reliability Study of Grating Coupled Semiconductor Laser Based on Raman Spectra Technique.Spectroscopy and Spectral Analysis,36(6).
MLA	Jia, P.,et al."Reliability Study of Grating Coupled Semiconductor Laser Based on Raman Spectra Technique".Spectroscopy and Spectral Analysis 36.6(2016).