QQ客服 官方微博 反馈留言

	Interface and electronic characterization of thin epitaxial Co(3)O(4) films
	Vaz, C. A. F. ; Wang, H. -Q. ; Ahn, C. H. ; Henrich, V. E. ; Baykara, M. Z. ; Schwendemann, T. C. ; Pilet, N. ; Albers, B. J. ; Schwarz, U. D. ; Zhang, L. H. ; Zhu, Y. ; Wang, J. ; Altman, E. I. ; Wang HQ(王惠琼)
	2009
关键词	Co3O4 Spinel Interface structure Polar surfaces Surface termination
英文摘要	The interface and electronic structure of thin (similar to 20-74 nm) Co3O4(110) epitaxial films grown by oxygen-assisted molecular beam epitaxy on MgAl2O4(110) single crystal substrates have been investigated by means of real and reciprocal space techniques. As-grown film surfaces are found to be relatively disordered and exhibit an oblique low energy electron diffraction (LEED) pattern associated with the O-rich CoO2 bulk termination of the (110) surface. Interface and bulk film structure are found to improve significantly with post-growth annealing at 820 K in air and display sharp rectangular LEED patterns, suggesting a surface stoichiometry of the alternative Co2O2 bulk termination of the (110) surface. Non-contact atomic force microscopy demonstrates the presence of wide terraces separated by atomic steps in the annealed films that are not present in the as-grown structures; the step height of approximate to 2.7 angstrom corresponds to two atomic layers and confirms a single termination for the annealed films, consistent with the LEED results. A model of the (1 x 1) surfaces that allows for compensation of the polar surfaces is presented. (C) 2008 Elsevier B.V. All rights reserved.
语种	英语
内容类型	期刊论文
源URL	[http://dspace.xmu.edu.cn/handle/2288/69677]
专题	物理技术－已发表论文
推荐引用方式 GB/T 7714	Vaz, C. A. F.,Wang, H. -Q.,Ahn, C. H.,et al. Interface and electronic characterization of thin epitaxial Co(3)O(4) films[J],2009.
APA	Vaz, C. A. F..,Wang, H. -Q..,Ahn, C. H..,Henrich, V. E..,Baykara, M. Z..,...&王惠琼.(2009).Interface and electronic characterization of thin epitaxial Co(3)O(4) films..
MLA	Vaz, C. A. F.,et al."Interface and electronic characterization of thin epitaxial Co(3)O(4) films".(2009).

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。