Pressure-induced valence anomaly in TmTe probed by resonant inelastic x-ray scattering | |
Jarrige, I. ; Rueff, J. P. ; Shieh, S. R. ; Taguchi, M. ; Ohishi, Y. ; Matsumura, T. ; Wang, C. P. ; Ishii, H. ; Hiraoka, N. ; Cai, Y. Q. ; Wang CP(王翠萍) | |
2008 | |
关键词 | MIXED-VALENCE KONDO-LATTICE TRANSITION STATE |
英文摘要 | The pressure-induced valence transition in TmTe was investigated by resonant inelastic x-ray scattering at the Tm L(3) edge, a powerful probe of the rare-earth valent state. The data are analyzed within the Anderson impurity model which yields key parameters such as the Tm 4f-5d hybridization. In addition to the general tendency of the f electrons towards delocalization, we find a plateau in both the Tm valence and hybridization pressure dependences between 4.3 and 6.5 GPa which is interpreted in terms of an n-channel Kondo (NCK) screening process. This behavior is at odds with the usually continuous, single-channel Kondo-like f delocalization while being supported by the seminal calculations of the NCK temperature in Tm ion by Saso et al. Our study raises the interesting possibility that an NCK effect realized in a compressed mixed-valent f system could impede the concomitant electron delocalization. |
语种 | 英语 |
内容类型 | 期刊论文 |
源URL | [http://dspace.xmu.edu.cn/handle/2288/59761] |
专题 | 材料学院-已发表论文 |
推荐引用方式 GB/T 7714 | Jarrige, I.,Rueff, J. P.,Shieh, S. R.,et al. Pressure-induced valence anomaly in TmTe probed by resonant inelastic x-ray scattering[J],2008. |
APA | Jarrige, I..,Rueff, J. P..,Shieh, S. R..,Taguchi, M..,Ohishi, Y..,...&王翠萍.(2008).Pressure-induced valence anomaly in TmTe probed by resonant inelastic x-ray scattering.. |
MLA | Jarrige, I.,et al."Pressure-induced valence anomaly in TmTe probed by resonant inelastic x-ray scattering".(2008). |
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