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	Compact displacement measurement system based on microchip Nd: YAG laser with birefringence external cavity
	Tan, Y. ; Zhang, S.
	2010-10-12 ; 2010-10-12
关键词	Practical Theoretical or Mathematical/ birefringence displacement measurement laser mirrors measurement by laser beam microchip lasers/ compact displacement measurement system microchip Nd:YAG laser birefringence external cavity wave plate phase retardation external feedback mirror in-quadrature laser intensities channel laser intensities wavelength 1.064 mum/ A4262E Metrological applications of lasers A0630C Spatial variables measurement A4225L Birefringence (physical optics) A4260 Laser optical systems: design and operation B4360E Metrological applications of lasers B7320C Spatial variables measurement B4320G Solid lasers B4320M Laser accessories and instrumentation/ wavelength 1.064E-06 m
中文摘要	We demonstrate a method of displacement measurement based on Nd:YAG laser with birefringence external cavity. The measurement system is composed of Nd:YAG laser, a wave plate with phase retardation of 45 degrees and an external feedback mirror. Due to the birefringence effect, the external cavity modulates the laser output intensities in the two orthogonal directions with a phase difference of 90 degrees , which is two times to that of the wave plate. Both the in-quadrature laser intensities vary one period, when the external cavity length changes lambda /2. These two channel laser intensities with phase difference of 90 degrees can be subdivided to lambda /8 after 4-fold evaluation. The movement direction of external mirror can be distinguished by the lead or lag between these two channel signals. Our method can improve the resolution of displacement measurement 4 times that of conventional optical feedback, and reach 133 nm for a laser wavelength of 1.064 mu m.
语种	英语
出版者	Trans Tech Publications Ltd. ; Switzerland
内容类型	期刊论文
源URL	[http://hdl.handle.net/123456789/80356]
专题	清华大学
推荐引用方式 GB/T 7714	Tan, Y.,Zhang, S.. Compact displacement measurement system based on microchip Nd: YAG laser with birefringence external cavity[J],2010, 2010.
APA	Tan, Y.,&Zhang, S..(2010).Compact displacement measurement system based on microchip Nd: YAG laser with birefringence external cavity..
MLA	Tan, Y.,et al."Compact displacement measurement system based on microchip Nd: YAG laser with birefringence external cavity".(2010).

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