QQ客服 官方微博 反馈留言

	Measurements of thermal effusivity of a fine wire and contact resistance of a junction using a T type probe
	Wang, Jianli ; Gu, Ming ; Zhang, Xing ; Wu, Gangping
	2010-10-12 ; 2010-10-12
关键词	analogue-digital conversion effusion platinum probes thermal resistance thermal variables measurement virtual instrumentation wires HEAT CONDUCTIVITY DIFFUSIVITY CELL Instruments & Instrumentation Physics, Applied
中文摘要	The thermal effusivity of a fine wire and the thermal contact resistance of a junction have been measured by a modified T type probe using a periodic heating method. The modified T type probe is made of a short periodic heated platinum wire and a test wire with one end contacting to the midpoint of the hot wire. Dimensionless expressions for the temperature responses of the hot wire with respect to the thermal effusivity of the test wire and the thermal contact resistance of the junction between the test wire and the hot wire were presented. A measurement system based on a flexible resolution A/D board and a LABVIEW-based virtual lock-in was setup. The probe was further verified by measuring four kinds of commercially available metallic wires at room temperature. The obtained thermal contact resistances were repeatable, with the calculated thicknesses of about 1 to 2 mu m. The present method can further be applied to measure the thermal effusivity of nonconductive wires, and to analyze the thermal contact resistance of nano/microscale junction.
语种	英语 ; 英语
出版者	AMER INST PHYSICS ; MELVILLE ; CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA
内容类型	期刊论文
源URL	[http://hdl.handle.net/123456789/79100]
专题	清华大学
推荐引用方式 GB/T 7714	Wang, Jianli,Gu, Ming,Zhang, Xing,et al. Measurements of thermal effusivity of a fine wire and contact resistance of a junction using a T type probe[J],2010, 2010.
APA	Wang, Jianli,Gu, Ming,Zhang, Xing,&Wu, Gangping.(2010).Measurements of thermal effusivity of a fine wire and contact resistance of a junction using a T type probe..
MLA	Wang, Jianli,et al."Measurements of thermal effusivity of a fine wire and contact resistance of a junction using a T type probe".(2010).

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。