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	Atomic force and confocal microscopy for the study of cortical cells cultured on silicon wafers
	Ma, J. ; Cui, F.Z. ; Liu, B.F. ; Xu, Q.Y.
	2010-10-12 ; 2010-10-12
关键词	Experimental/ adhesion atomic force microscopy biomedical materials cellular biophysics elemental semiconductors etching neural nets optical microscopy porous materials silicon surface roughness tissue engineering/ atomic force microscopy confocal laser scanning microscopy primary cortical cell culture chemically roughened silicon substrates neural network development cell adherence nanorange roughness chemical etching hydrofluoric acid porous structures neuron cells extracellular matrix components neuronal adhesion neurite outgrowth time 7 day Si/ A8770M Biomedical materials A8730 Biophysics of neurophysiological processes A8725 Cellular biophysics A6820 Solid surface structure A8160C Surface treatment and degradation in semiconductor technology/ time 6.048E+05 s/ Si/sur Si/el
中文摘要	The primary cortical cells were selected as a model to study the adherence and neural network development on chemically roughened silicon substrates without any coatings using confocal laser scanning microscopy (CLSM) and atomic force microscopy (AFM). The silicon substrates have a nano-range roughness (RMS) achieved by chemical etching using hydrofluoric (HF) acid. After 7 days of culturing, the neurons were observed to connect together and form dense neural networks. Furthermore, AFM results revealed that some porous structures at a few micrometer range existed between the neuron cells and the silicon substrates. It is suggested that the porous structures are made of extracellular matrix (ECM) components and play an important role in the neuronal adhesion and neurite outgrowth on the inert silicon wafers.
语种	英语
出版者	Springer New York ; USA
内容类型	期刊论文
源URL	[http://hdl.handle.net/123456789/78255]
专题	清华大学
推荐引用方式 GB/T 7714	Ma, J.,Cui, F.Z.,Liu, B.F.,et al. Atomic force and confocal microscopy for the study of cortical cells cultured on silicon wafers[J],2010, 2010.
APA	Ma, J.,Cui, F.Z.,Liu, B.F.,&Xu, Q.Y..(2010).Atomic force and confocal microscopy for the study of cortical cells cultured on silicon wafers..
MLA	Ma, J.,et al."Atomic force and confocal microscopy for the study of cortical cells cultured on silicon wafers".(2010).

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