QQ客服 官方微博 反馈留言

	Thickness dependent size effect of BiFeO3 films grown on LaNiO3-buffered Si substrates
	Wang, Yao ; Lin, Yuanhua ; Nan, Ce-Wen
	2010-10-12 ; 2010-10-12
关键词	antiferromagnetic materials bismuth compounds dielectric hysteresis dielectric polarisation electric domains ferroelectric thin films magnetic anisotropy magnetic moments magnetic thin films magnetisation magnetoelastic effects multiferroics Raman spectra sol-gel processing spin coating X-ray diffraction FERROELECTRIC THIN-FILMS Physics, Applied
中文摘要	BiFeO3 films of different thicknesses were grown on the LaNiO3-buffered Si (100) substrate via a sol-gel spin-coating processing. X-ray diffraction and Raman spectra studies revealed a thickness dependent structural and strain state evolution. The thickness dependent size effect on ferroelectric behavior was reflected in the polarization versus electric field hysteresis loops and domain structures. Enhancement in magnetization of the thin BiFeO3 films resulted from the strain-induced canting antiferromagnetic structure, and remarkable anisotropy was observed in the 40 nm BiFeO3 film as well due to the magnetoelastic effect induced by strain. With the increase in the film thickness, the magnetic moment of BiFeO3 films decreased back to the ordinary canted antiferromagnetic state.
语种	英语 ; 英语
出版者	AMER INST PHYSICS ; MELVILLE ; CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA
内容类型	期刊论文
源URL	[http://hdl.handle.net/123456789/78186]
专题	清华大学
推荐引用方式 GB/T 7714	Wang, Yao,Lin, Yuanhua,Nan, Ce-Wen. Thickness dependent size effect of BiFeO3 films grown on LaNiO3-buffered Si substrates[J],2010, 2010.
APA	Wang, Yao,Lin, Yuanhua,&Nan, Ce-Wen.(2010).Thickness dependent size effect of BiFeO3 films grown on LaNiO3-buffered Si substrates..
MLA	Wang, Yao,et al."Thickness dependent size effect of BiFeO3 films grown on LaNiO3-buffered Si substrates".(2010).

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。