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Sol-gel processing and characterization of (Na,K)NbO3 lead-free ferroelectric films
Lai, Fengping ; Li, Jing-Feng
2010-05-10 ; 2010-05-10
会议名称FERROELECTRICS ; 5th Asian Meeting on Ferroelectrics (AMF-5) ; Noda, JAPAN ; Web of Science
关键词NaNbO3-KNbO3 sol-gel lead-free ferroelectric thin film PULSED-LASER DEPOSITION NA0.5K0.5NBO3 THIN-FILMS PIEZOELECTRIC PROPERTIES CERAMICS Materials Science, Multidisciplinary Physics, Condensed Matter
中文摘要Lead-free piezoelectric Na0.5K0.5NbO3 (NKN) thin films were prepared via sol-gel processing on both Pt (111)/Ti/SiO2/Si(100) and Si(100) substrates. XRD analysis showed that perovskite structure was achieved after annealing at 800 similar to 900 degrees C The SEM morphology showed the NKN films with a total thickness of about 0.5 micron had relatively dense and uniform microstructure. Ferroelectric properties of NKN thin films are characterized at room temperature and the P-E hysteresis loop proved the ferroelectricity of the NKN films. The compensation of volatile components can help control the stoichiometry of the films and improve the film quality.; Tokyo Univ Sci
会议录出版者TAYLOR & FRANCIS LTD ; ABINGDON ; 4 PARK SQUARE, MILTON PARK, ABINGDON OX14 4RN, OXON, ENGLAND
语种英语 ; 英语
内容类型会议论文
源URL[http://hdl.handle.net/123456789/18211]  
专题清华大学
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Lai, Fengping,Li, Jing-Feng. Sol-gel processing and characterization of (Na,K)NbO3 lead-free ferroelectric films[C]. 见:FERROELECTRICS, 5th Asian Meeting on Ferroelectrics (AMF-5), Noda, JAPAN, Web of Science.
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