Studies on the relax behavior of SrBi/sub 2/Ta/sub 2/O /sub 9/ thin films | |
Kan-Hao Xue ; Zhi-Gang Zhang ; Dan Xie ; Chao-Gang Wei ; Tian-Zhi Liu ; Tian-Ling Ren ; Li-Tian Liu | |
2010-05-07 ; 2010-05-07 | |
关键词 | Experimental/ bismuth compounds dielectric relaxation ferroelectric materials ferroelectric thin films strontium compounds/ relaxation curve voltage change polarization delay logarithmic time axes logarithmic damping applied voltage probe polarity SrBi/sub 2/Ta/sub 2/O/sub 9// A7755 Dielectric thin films A7740 Dielectric loss and relaxation A7780 Ferroelectricity and antiferroelectricity/ SrBi2Ta2O9/ss Bi2/ss Ta2/ss Bi/ss O9/ss Sr/ss Ta/ss O/ss |
中文摘要 | Relax behavior of SrBi/sub 2/Ta/sub 2/O/sub 9/ thin film is investigated. In very short-time scale (less than 10 mu s), the relaxation curve follows the characteristics of the voltage change, due to the signal and polarization delay. After 100 mu s's relax time, the curve tends to be linear in logarithmic time axes, suggesting that the decay of retained polarization is logarithmic damping. Applied voltage and probe polarity can influence the relaxation curve. Higher applied voltage causes higher decay rate. This can be attributed to the depolarization field, which aggravates the retained polarization's decay. Different probe polarities cause different curves, probably due to the asymmetry of the top electrode and the bottom electrode. |
语种 | 英语 ; 英语 |
出版者 | Gordon & Breach ; Netherlands |
内容类型 | 期刊论文 |
源URL | [http://hdl.handle.net/123456789/16423] |
专题 | 清华大学 |
推荐引用方式 GB/T 7714 | Kan-Hao Xue,Zhi-Gang Zhang,Dan Xie,et al. Studies on the relax behavior of SrBi/sub 2/Ta/sub 2/O /sub 9/ thin films[J],2010, 2010. |
APA | Kan-Hao Xue.,Zhi-Gang Zhang.,Dan Xie.,Chao-Gang Wei.,Tian-Zhi Liu.,...&Li-Tian Liu.(2010).Studies on the relax behavior of SrBi/sub 2/Ta/sub 2/O /sub 9/ thin films.. |
MLA | Kan-Hao Xue,et al."Studies on the relax behavior of SrBi/sub 2/Ta/sub 2/O /sub 9/ thin films".(2010). |
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