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	Non-columnar grained microstructure in ferroelectric PZT thin films via concentration graded CSD
	NingXin Zhang ; Yi Yang ; TianLing Ren ; LiTian Liu
	2010-05-07 ; 2010-05-07
关键词	Experimental/ crystal microstructure ferroelectric thin films lead compounds liquid phase deposition nucleation transmission electron microscopy X-ray diffraction/ ferroelectric PZT thin films noncolumnar grained structure chemical solution deposition XRD analysis perovskite phase C-V curves P-E loops dielectric properties ferroelectric properties microstructures TEM grain nucleation PZT PbZrO3TiO3/ A6855 Thin film growth, structure, and epitaxy A8115L Deposition from liquid phases (melts and solutions) A7755 Dielectric thin films A7780 Ferroelectricity and antiferroelectricity A6480G Microstructure B2810F Piezoelectric and ferroelectric materials B0520J Deposition from liquid phases/ PbZrO3TiO3/ss TiO3/ss ZrO3/ss O3/ss Pb/ss Ti/ss Zr/ss O/ss
中文摘要	A new kind of PZT film with non-columnar grained structure was prepared by chemical solution deposition, where PZT layers with increasing and decreasing precursors' concentration were deposited layer by layer. XRD analysis revealed the formation of perovskite phase in both thin films. However, C-V curves and P-E loops reflected different dielectric and ferroelectric properties. Different microstructures were observed in the upper part and lower part of the as prepared thin films during TEM investigation, which was attributed to different mechanisms of grain nucleation and growth process due to varied precursor concentration.
语种	英语 ; 英语
出版者	Gordon & Breach ; Netherlands
内容类型	期刊论文
源URL	[http://hdl.handle.net/123456789/16376]
专题	清华大学
推荐引用方式 GB/T 7714	NingXin Zhang,Yi Yang,TianLing Ren,et al. Non-columnar grained microstructure in ferroelectric PZT thin films via concentration graded CSD[J],2010, 2010.
APA	NingXin Zhang,Yi Yang,TianLing Ren,&LiTian Liu.(2010).Non-columnar grained microstructure in ferroelectric PZT thin films via concentration graded CSD..
MLA	NingXin Zhang,et al."Non-columnar grained microstructure in ferroelectric PZT thin films via concentration graded CSD".(2010).

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