Electron trapping materials for use in a picosecond infrared streak camera

CORC > 西安光学精密机械研究所 > 中国科学院西安光学精密机械研究所 > 瞬态光学技术国家重点实验室

	Electron trapping materials for use in a picosecond infrared streak camera
	Fan, WH; Hou, XH ; Du, L ; Niu, LH ; Zhao, W ; Zhang, XQ
刊名	review of scientific instruments
	1999-12-01
卷号	70 期号:12 页码:4482-4486
合作状况	其它
英文摘要	we describe our research on the employment of an infrared upconversion screen made of electron trapping material (etm) in combination with the high sensitivity of the s-20 photocathode responsive to visible radiation to produce a streak camera arrangement capable of viewing and recording infrared incident pulses. the etm-based upconversion screen converts 800-1600 nm infrared radiation to visible light which is viewed or recorded by the s-20 photocathode. the peak values of the upconversion efficiency are located at 1165 nm for cas:eu, sm and 1060 nm for cas:ce, sm. the present experiment showed time resolution was 12.3 ps for a cas:eu, sm screen and 8.4 ps for a cas:ce, sm screen. the minimum detectability is 4.8 x 10(-9) j/mm(2) (minimum detectability of the coupled visible streak camera is 8.3x10(-10) j/mm(2)). other parameters, such as spatial resolution and dynamic range, have also been measured and analyzed. the results show etm can be used in the measurement of infrared ultrafast phenomena up to picosecond time domain. in consideration of the limited number of trapped electrons in etm, the infrared-sensitive streak camera consisting of an etm-based upconversion screen is suitable to operate in the single shot mode. (c) 1999 american institute of physics. [s0034-6748(99)00112-4].
学科主题	光学
WOS标题词	science & technology ; technology ; physical sciences
类目[WOS]	instruments & instrumentation ; physics, applied
研究领域[WOS]	instruments & instrumentation ; physics
关键词[WOS]	alkaline-earth sulfides ; luminescence
收录类别	SCI ; EI
语种	英语
WOS记录号	WOS:000084052100005
公开日期	2010-12-15
内容类型	期刊论文
源URL	[http://ir.opt.ac.cn/handle/181661/8427]
专题	西安光学精密机械研究所_瞬态光学技术国家重点实验室
作者单位	1.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Technol, Xian 710068, Peoples R China 2.Xian Jiao Tong Univ, Fac Sci, Inst Modern Phys, Xian 710049, Peoples R China
推荐引用方式 GB/T 7714	Fan, WH,Hou, XH,Du, L,et al. Electron trapping materials for use in a picosecond infrared streak camera[J]. review of scientific instruments,1999,70(12):4482-4486.
APA	Fan, WH,Hou, XH,Du, L,Niu, LH,Zhao, W,&Zhang, XQ.(1999).Electron trapping materials for use in a picosecond infrared streak camera.review of scientific instruments,70(12),4482-4486.
MLA	Fan, WH,et al."Electron trapping materials for use in a picosecond infrared streak camera".review of scientific instruments 70.12(1999):4482-4486.