Catastrophic Degradation of InGaN/GaN Blue Laser Diodes

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	Catastrophic Degradation of InGaN/GaN Blue Laser Diodes
	Wen, Pengyan(温鹏雁); Zhang, Shuming(张书明); Liu, Jianping(刘建平); Li, Deyao(李德尧); Zhang, Liqun(张立群); Zhou, Kun; Su, Xujun(苏旭军); Tian, Aiqin(田爱琴); Zhang, Feng(张丰); Yang, Hui(杨辉)
刊名	IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
	2016
卷号	16 期号:4 页码:638-641
关键词	Catastrophic degradation InGaN/GaN laser diodes (LDs) transmission electron microscopy (TEM)
通讯作者	Zhang, Shuming(张书明)
英文摘要	A study of catastrophic degradation of InGaN/GaN laser diodes (LDs) is presented. Local damage on the aged LD is identified with the reduction of the electron beam induced current intensity. A pipe-shaped defect is observed in the particular damaged region by using the transmission electron microscopy (TEM) and scanning TEM technique. Diffusion of the contact metal along the defect is enhanced by the local electric field and high temperature. Catastrophic degradation of the LD occurs due to burning of the local region.
关键词[WOS]	GAN
收录类别	SCI ; EI
语种	英语
WOS记录号	WOS:000389852400032
内容类型	期刊论文
源URL	[http://ir.sinano.ac.cn/handle/332007/4642]
专题	苏州纳米技术与纳米仿生研究所_纳米器件及相关材料研究部_刘建平团队
推荐引用方式 GB/T 7714	Wen, Pengyan,Zhang, Shuming,Liu, Jianping,et al. Catastrophic Degradation of InGaN/GaN Blue Laser Diodes[J]. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY,2016,16(4):638-641.
APA	Wen, Pengyan.,Zhang, Shuming.,Liu, Jianping.,Li, Deyao.,Zhang, Liqun.,...&Yang, Hui.(2016).Catastrophic Degradation of InGaN/GaN Blue Laser Diodes.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY,16(4),638-641.
MLA	Wen, Pengyan,et al."Catastrophic Degradation of InGaN/GaN Blue Laser Diodes".IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 16.4(2016):638-641.