Scanning Kelvin Probe Microscopy Investigation of the Role of Minority Carriers on the Switching Characteristics of Organic Field-Effect Transistors

	Scanning Kelvin Probe Microscopy Investigation of the Role of Minority Carriers on the Switching Characteristics of Organic Field-Effect Transistors
	Hu, Yuanyuan 1; Pecunia, Vincenzo 1; Jiang, Lang 1; Di, Chong-An 2; Gao, Xike 3; Sirringhaus, Henning 1
刊名	ADVANCED MATERIALS
	2016-06-15
卷号	28 期号:23 页码:4713-4719
英文摘要	A method based on scanning Kelvin probe microscopy is developed to probe the effects of minority carriers on the switching characteristics of organic field-effect transistors. The mobility of the minority carriers is extracted and the role they play in screening of the gate potential in the OFF state and in recombination of trapped majority carriers trapped after an ON state is understood.
收录类别	SCI
语种	英语
内容类型	期刊论文
源URL	[http://ir.iccas.ac.cn/handle/121111/35785]
专题	化学研究所_有机固体实验室
作者单位	1.Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England 2.Chinese Acad Sci, Inst Chem, Key Lab Organ Solids, Beijing Natl Lab Mol Sci, Beijing 100190, Peoples R China 3.Chinese Acad Sci, Shanghai Inst Organ Chem, Mat Sci Lab, 345 Lingling Lu, Shanghai 200032, Peoples R China
推荐引用方式 GB/T 7714	Hu, Yuanyuan,Pecunia, Vincenzo,Jiang, Lang,et al. Scanning Kelvin Probe Microscopy Investigation of the Role of Minority Carriers on the Switching Characteristics of Organic Field-Effect Transistors[J]. ADVANCED MATERIALS,2016,28(23):4713-4719.
APA	Hu, Yuanyuan,Pecunia, Vincenzo,Jiang, Lang,Di, Chong-An,Gao, Xike,&Sirringhaus, Henning.(2016).Scanning Kelvin Probe Microscopy Investigation of the Role of Minority Carriers on the Switching Characteristics of Organic Field-Effect Transistors.ADVANCED MATERIALS,28(23),4713-4719.
MLA	Hu, Yuanyuan,et al."Scanning Kelvin Probe Microscopy Investigation of the Role of Minority Carriers on the Switching Characteristics of Organic Field-Effect Transistors".ADVANCED MATERIALS 28.23(2016):4713-4719.