The Influence of the Silicon/Silicon Oxide Space Charge Region on Excess Charge Carrier Kinetics in Silicon
刊名Physica Status Solidi B-Basic Solid State Physics
2011
卷号248期号:2页码:352-360
关键词heterojunctions silicon SiO(2) surface photovoltage time-resolved conductivity
语种英语
内容类型期刊论文
源URL[http://202.127.2.71:8080/handle/181331/11222]  
专题上海技术物理研究所_全文传递文献库_qwcd 期刊论文
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GB/T 7714
. The Influence of the Silicon/Silicon Oxide Space Charge Region on Excess Charge Carrier Kinetics in Silicon[J]. Physica Status Solidi B-Basic Solid State Physics,2011,248(2):352-360.
APA (2011).The Influence of the Silicon/Silicon Oxide Space Charge Region on Excess Charge Carrier Kinetics in Silicon.Physica Status Solidi B-Basic Solid State Physics,248(2),352-360.
MLA "The Influence of the Silicon/Silicon Oxide Space Charge Region on Excess Charge Carrier Kinetics in Silicon".Physica Status Solidi B-Basic Solid State Physics 248.2(2011):352-360.
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