| 题名 | 触摸屏模组光电检测技术研究 |
| 作者 | 刘杰 |
| 学位类别 | 硕士 |
| 答辩日期 | 2016 |
| 授予单位 | 中国科学院上海光学精密机械研究所 |
| 导师 | 阮昊 |
| 关键词 | 触摸屏 检测 机器视觉 智能算法 |
| 其他题名 | Studying on photoelectric detection technology of touch screen module |
| 中文摘要 | 近几年来，触摸屏的研究和应用发展非常迅速。如今，触摸屏的使用已经被广泛应用在手机、平板、可穿戴设备、家电设备、工业等。其中，电容式触摸屏以其高透光率、高灵敏度、寿命长、支持多点触控等优点得到了广泛的应用。电容触摸屏的广泛应用对其触摸性能与生产质量的保证提出了更高的要求，以往的触摸屏厂商对触摸屏的质量检测都是靠人工的方式，这种方式效率低，成本高。 本课题通过研究电容触摸屏的各种性能参数及缺陷类型，提出了电容触摸屏的电学性能检测方法和光学性能检测方法。对于电学性能检测方法，本论文首先分析了用于描述电容触摸屏电学性能的各种参数并给出具体计算方法，然后给出了检测装置的设计架构及运动控制系统的实现，并给出了利用此系统对电容触摸屏的测试结果。其次本论文还介绍了电容触摸屏的物理缺陷特征及其检测方法，通过数字图像处理技术对采集到的含有缺陷的电容触摸屏图像进行处理得到缺陷特征，并给出了缺陷图像的数学描述及分类识别。 |
| 英文摘要 | In recent years, the research and application of touch screen have been developed drastically. Nowadays, touch screen has been widely used in mobile phones, tablets, wearable devices, home appliances, industrial, and so on. Among them, the capacitive touch screen has been widely applied by virtue of its high light transmittance, high sensitivity, long service life, multi-touch supporting and other advantages, which put forward higher requirements for its touching performance and production quality. Previous touch screen manufacturers detected the quality of touch screen by manual way, which had low efficiency and high cost. Through the study of various defect types and performance parameters of capacitive touch screen, this paper puts forward an electrical performance testing method and an optical performance detecting method. For the electrical performance testing method, firstly, the various electrical performance parameters and concrete calculation formulas for describing the capacitive touch screen are exhibited. Secondly, the design architecture of testing device and the implementation of motion control system are shown, and the test results of capacitive touch screen by using this system are further obtained. Moreover, this paper also introduced the physical defects characteristics of capacitive touch screen and its defecting method. The collected capacitive touch screen images with defects are processed through digital image processing technology to obtain defect characteristics, and the mathematical description and classification of the defect images are displayed as well. |
| 语种 | 中文 |
| 内容类型 | 学位论文 |
| 源URL | [http://ir.siom.ac.cn/handle/181231/16963]  |
| 专题 | 上海光学精密机械研究所_学位论文 |
| 推荐引用方式 GB/T 7714 | 刘杰. 触摸屏模组光电检测技术研究[D]. 中国科学院上海光学精密机械研究所. 2016. |
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