古代瓷釉光学相干层析图像的纹理特征分析研究
严鑫; 董俊卿; 刘卫东; 李青会
刊名中国激光
2015
卷号42期号:5页码:508008
其他题名Research on Texture Characteristics Analysis of Ancient Glaze Optical Coherence Tomographic Image
通讯作者Yan Xin, Center of Sci-Tech Archaeology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China. ; Dong Junqing, Center of Sci-Tech Archaeology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China. ; Liu Weidong, Center of Sci-Tech Archaeology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China. ; Li Qinghui, Center of Sci-Tech Archaeology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China.
中文摘要为了对古代瓷釉的结构特征进行量化表征,基于图像的统计直方图以及灰度共生矩阵提取出了7个纹理特征参数,用来对4种不同类型典型素面瓷釉样品的光学相干层析(OCT)图像进行描述。对比分析发现4种瓷釉的7个纹理特征参数差异明显。同时利用未知样品对基于K-邻近分类和7个纹理特征参数的瓷釉自动识别方案进行了可行性验证,得到了未知样品的正确的分类结果。实验结果表明:7个特征参数可以很好地表征瓷釉的釉层结构特征,基于K-邻近分类和纹理特征参数量化分析的瓷釉快速自动识别方案是可行的,且具有广泛的应用前景。
英文摘要In order to quantify the structural characteristics of ancient porcelain glazes, seven texture characteristic parameters, which are used to describe the optical coherence tomographic (OCT) images of four typical plain enamel samples, are extracted based on image histogram and gray level co-occurrence matrix. The differences between the seven texture characteristic parameters of four kinds of glazes are obvious. The feasibility of glaze recognition scheme based on K-neighbor classification and quantitative analysis of texture feature parameters is certified by using an unknown sample. Experimental results show that seven characteristic parameters can characterize the glaze layer structure characteristics commendably. The glaze recognition scheme based on Kneighbor classification and quantitative analysis of texture feature parameters is feasible and promising.
收录类别EI
原文出处http://www.opticsjournal.net
语种中文
内容类型期刊论文
版本出版稿
源URL[http://ir.siom.ac.cn/handle/181231/13846]  
专题上海光学精密机械研究所_高密度光存储技术实验室
作者单位1.严鑫, 中国科学院上海光学精密机械研究所科技考古中心, 上海 201800, 中国.
2.董俊卿, 中国科学院上海光学精密机械研究所科技考古中心, 上海 201800, 中国.
3.刘卫东, 中国科学院上海光学精密机械研究所科技考古中心, 上海 201800, 中国.
4.李青会, 中国科学院上海光学精密机械研究所科技考古中心, 上海 201800, 中国.
推荐引用方式
GB/T 7714
严鑫,董俊卿,刘卫东,等. 古代瓷釉光学相干层析图像的纹理特征分析研究[J]. 中国激光,2015,42(5):508008.
APA 严鑫,董俊卿,刘卫东,&李青会.(2015).古代瓷釉光学相干层析图像的纹理特征分析研究.中国激光,42(5),508008.
MLA 严鑫,et al."古代瓷釉光学相干层析图像的纹理特征分析研究".中国激光 42.5(2015):508008.
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