Measurement of crystal defects using phase retrieval technique

CORC > 上海光学精密机械研究所 > 中国科学院上海光学精密机械研究所 > 高功率激光物理国家实验室

	Measurement of crystal defects using phase retrieval technique
	Yao, Yudong ; Zhang, Junyong ; Zhang, Yanli ; Zhu, Jianqiang
	2015
会议名称	20th international symposium on high power laser systems and applications (hpls and a)
通讯作者	yao, yd (reprint author), chinese acad sci, shanghai inst opt & fine mech, shanghai 201800, peoples r china.
英文摘要	in high power laser systems, crystal defects introduced by manufacturing have significant impact on quality of light beams; finally affect the output status of high power laser system. the phase retrieval algorithm can precisely measure the crystal defects, such as the residual periodic perturbations in a relatively large area and the relatively small point defects, with the resolution of micrometer magnitude. at the same time, the multiple near-focus intensity measurements algorithm used here can retrieve the morphology of focal spot, which is modulated by the defects and cannot be directly measured due to its high power. in addition, the algorithm has been improved in order to use less measurement planes and less iteration times to complete retrieval.
收录类别	CPCI
会议录	proc.spie
会议录出版者	spie-int soc optical engineering
语种	英语
内容类型	会议论文
源URL	[http://ir.siom.ac.cn/handle/181231/17174]
专题	上海光学精密机械研究所_高功率激光物理国家实验室
作者单位	1.[Yao, Yudong 2.Zhang, Junyong 3.Zhang, Yanli 4.Zhu, Jianqiang] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China
推荐引用方式 GB/T 7714	Yao, Yudong,Zhang, Junyong,Zhang, Yanli,et al. Measurement of crystal defects using phase retrieval technique[C]. 见:20th international symposium on high power laser systems and applications (hpls and a).