Development of synchrotron radiation X-ray grazing incident diffraction method

	Development of synchrotron radiation X-ray grazing incident diffraction method
	Jiang XM(姜晓明); Jia QJ(贾全杰); Zheng WL(郑文莉); 刘鹏(多); Xian DC(冼鼎昌); Jiang, XM; Jia, QJ; Zheng, WL; Liu, P; Xian, DC
刊名	HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION
	2000
卷号	24 期号:12 页码:1185-1190
关键词	grazing incident diffraction surface structure quantum dot weak signal
通讯作者	CAS, Inst High Energy Phys, Beijing 100039, Peoples R China ; Fudan Univ, Surface Phys Natl Key Lab, Shanghai 200433, Peoples R China
英文摘要	Synchrotron radiation X-ray grazing incident diffraction (GID) method was developed based on the five-circle diffractometer in the Diffuse Scattering Station at Beijing Synchrotron Radiation Facility. The lateral strain induced by the Ge/Si quantum dotswas measured successfully, which showed the capability of the GID method in measuring weak signals from surface structures. The results showed that the formation of Ge/Si quantum dots caused both the lateral expansion-strain and contraction-strain in the surface layer of Si(001) substrate.
学科主题	Physics
类目[WOS]	Physics, Nuclear ; Physics, Particles & Fields
研究领域[WOS]	Physics
原文出处	SCI
语种	英语
WOS记录号	WOS:000166175000017
内容类型	期刊论文
源URL	[http://ir.ihep.ac.cn/handle/311005/239156]
专题	高能物理研究所_院士中国科学院高能物理研究所_人力资源处中国科学院高能物理研究所_中国散裂中子源
作者单位	中国科学院高能物理研究所
推荐引用方式 GB/T 7714	Jiang XM,Jia QJ,Zheng WL,et al. Development of synchrotron radiation X-ray grazing incident diffraction method[J]. HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,2000,24(12):1185-1190.
APA	姜晓明.,贾全杰.,郑文莉.,刘鹏.,冼鼎昌.,...&Wang, X.(2000).Development of synchrotron radiation X-ray grazing incident diffraction method.HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,24(12),1185-1190.
MLA	姜晓明,et al."Development of synchrotron radiation X-ray grazing incident diffraction method".HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION 24.12(2000):1185-1190.