Comparison of valence band x-ray photoelectron spectrum between Al-N-codoped and N-doped ZnO films | |
Cong, GW; Peng, WQ; Wei, HY; Han, XX; Wu, JJ; Liu, XL; Zhu, QS; Wang, ZG; Lu, JG; Ye, ZZ | |
刊名 | APPLIED PHYSICS LETTERS |
2006 | |
卷号 | 88期号:6页码:602110 |
通讯作者 | Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China ; Zhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China ; Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, Beijing 100039, Peoples R China |
英文摘要 | The valence band structures of Al-N-codoped [ZnO:(Al, N)] and N-doped (ZnO:N) ZnO films were studied by normal and soft x-ray photoelectron spectroscopy. The valence-band maximum of ZnO:(Al, N) shifts up to Fermi energy level by about 300 meV compared with that of ZnO:N. Such a shift can be attributed to the existence of a kind of Al-N in ZnO:(Al, N), as supported by core level XPS spectra and comparison of modified Auger parameters. Al-N increased the relative quantity of Zn-N in ZnO:(Al, N), while N-N decreased that of Zn-N in ZnO:N. (c) 2006 American Institute of Physics. |
学科主题 | Physics |
类目[WOS] | Physics, Applied |
研究领域[WOS] | Physics |
原文出处 | SCI |
语种 | 英语 |
WOS记录号 | WOS:000235252800055 |
内容类型 | 期刊论文 |
源URL | [http://ir.ihep.ac.cn/handle/311005/241070] |
专题 | 高能物理研究所_多学科研究中心 |
作者单位 | 中国科学院高能物理研究所 |
推荐引用方式 GB/T 7714 | Cong, GW,Peng, WQ,Wei, HY,et al. Comparison of valence band x-ray photoelectron spectrum between Al-N-codoped and N-doped ZnO films[J]. APPLIED PHYSICS LETTERS,2006,88(6):602110. |
APA | Cong, GW.,Peng, WQ.,Wei, HY.,Han, XX.,Wu, JJ.,...&胡天斗.(2006).Comparison of valence band x-ray photoelectron spectrum between Al-N-codoped and N-doped ZnO films.APPLIED PHYSICS LETTERS,88(6),602110. |
MLA | Cong, GW,et al."Comparison of valence band x-ray photoelectron spectrum between Al-N-codoped and N-doped ZnO films".APPLIED PHYSICS LETTERS 88.6(2006):602110. |
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