Degradation and stabilization of perovskite membranes containing silicon impurity at low temperature | |
Liu, Yan1,2; Zhu, Xuefeng1; Li, Mingrun1; Li, Wenping1,2; Yang, Weishen1 | |
刊名 | journal of membrane science |
2015-10-15 | |
卷号 | 492期号:1页码:173-180 |
关键词 | MIEC membrane Silicon impurity Low temperature Degradation Perovskite |
通讯作者 | 朱雪峰 ; 杨维慎 |
英文摘要 | the oxygen permeation flux of a mixed ionic-electronic conducting membrane bace0.1co0.4fe0.5o3-delta (bccf) decreased by 62% after 477 h on-stream operation under air/he gradient at 600 degrees c. to understand this phenomenon, the spent membrane was examined via several characterization techniques. scanning electron microscopy (sem) and energy dispersive x-ray (eds) analyses revealed that the surface of the sweep side has a higher silicon impurity content than that of the feed side. in fact, the bccf powder contained up to 140 ppm of silicon impurities, which originated from the original chemicals and/or was introduced during preparation of the material. after the 477 h operation at 600 degrees c, a similar to 25 nm-thick amorphous silicon-containing layer was detected by high resolution transmission electron microscopy (hrtem) on the sweep side surface of the spent membrane. a possible mechanism related to silicon migration from membrane bulk to surfaces was proposed to explain the degradation phenomenon. to overcome the negative effects of silicon impurity, a simple and effective method was proposed to stabilize the oxygen permeation fluxes at low temperatures, i.e. coating a porous sm0.5sr0.5coo3-delta (ssc) catalyst on both surfaces of the membrane to accommodate the silicon impurily and accelerate oxygen exchange kinetics. with this method, the oxygen permeation was stabilized for 500 h at 600 degrees c. (c) 2015 elsevier b.v. all rights reserved. |
学科主题 | 物理化学 |
WOS标题词 | science & technology ; technology ; physical sciences |
类目[WOS] | engineering, chemical ; polymer science |
研究领域[WOS] | engineering ; polymer science |
关键词[WOS] | oxygen permeable membrane ; dual-phase membranes ; mixed-oxide (a,b)o ; ceramic membranes ; cathode material ; structural stability ; hydrogen-production ; potential gradient ; co2 capture ; fuel-cells |
收录类别 | SCI |
语种 | 英语 |
WOS记录号 | WOS:000358433600019 |
公开日期 | 2016-05-09 |
内容类型 | 期刊论文 |
源URL | [http://cas-ir.dicp.ac.cn/handle/321008/143769] |
专题 | 大连化学物理研究所_中国科学院大连化学物理研究所 |
作者单位 | 1.Chinese Acad Sci, Dalian Inst Chem Phys, State Key Lab Catalysis, Dalian 116023, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100039, Peoples R China |
推荐引用方式 GB/T 7714 | Liu, Yan,Zhu, Xuefeng,Li, Mingrun,et al. Degradation and stabilization of perovskite membranes containing silicon impurity at low temperature[J]. journal of membrane science,2015,492(1):173-180. |
APA | Liu, Yan,Zhu, Xuefeng,Li, Mingrun,Li, Wenping,&Yang, Weishen.(2015).Degradation and stabilization of perovskite membranes containing silicon impurity at low temperature.journal of membrane science,492(1),173-180. |
MLA | Liu, Yan,et al."Degradation and stabilization of perovskite membranes containing silicon impurity at low temperature".journal of membrane science 492.1(2015):173-180. |
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