Height information acquisition method of seedling with machine vision | |
Zhang WQ(张文强); Li W(李伟); Yang ZY(杨振宇); Han JD(韩建达) | |
2015 | |
会议名称 | 2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER) |
会议日期 | June 8-12, 2015 |
会议地点 | Shenyang, China |
关键词 | image processing machine vision image recognition seedling transplanting height |
页码 | 1446-1449 |
中文摘要 | In plant factory, transplanting as an important step of nursery seedling process, it is necessary to achieve its automation and intelligence. To improve the survival rate of seedling transplanting, the fitness of transplanting seeding need to be distinguished. Seedling height, an important indicator of transplanting fitness, this paper attempts to use machine vision identify technology to analysis and judgment the height information rapidly to meet the transplanting requirements. In this paper, with the color images of pepper seedling as sample, the main stem characteristics of seedling were extracted out by using image processing algorithms. Then, the key points of every potted-seedling trunk were extracted by a Harris corner detection algorithm. The fitting line was obtained by the weighted least-squares linear fitting with the key points, and found out the maximum y-coordinate difference of all corners coordinates in each strain of potted-seedling. The average relative deviation algorithm of Harris corner detection algorithm with principal axis method was 2.85%. |
收录类别 | EI ; CPCI(ISTP) |
产权排序 | 2 |
会议录 | 2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER) |
会议录出版者 | IEEE |
会议录出版地 | Piscataway, NJ, USA |
语种 | 英语 |
ISSN号 | 2379-7711 |
ISBN号 | 978-1-4799-8730-6 |
WOS记录号 | WOS:000380502300264 |
内容类型 | 会议论文 |
源URL | [http://ir.sia.cn/handle/173321/18513] |
专题 | 沈阳自动化研究所_机器人学研究室 |
推荐引用方式 GB/T 7714 | Zhang WQ,Li W,Yang ZY,et al. Height information acquisition method of seedling with machine vision[C]. 见:2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER). Shenyang, China. June 8-12, 2015. |
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