Probing Electronic Doping of Single-Walled Carbon Nanotubes by Gaseous Ammonia with Dielectric Force Microscopy
Di Lu(卢荻); Liwei Chen(陈立桅); Ting Zhang(张珽); Wei Lu(卢威); Liwei Chen(陈立桅)
刊名The Journal of Physical letters
2012-12-06
卷号3期号:23页码:3509-3512
关键词dielectric force microscopy (DFM) electrostatic force microscopy (EFM) single-walled carbon nanotube (SWNT) chemical sensing
通讯作者Liwei Chen(陈立桅)
英文摘要

The electronic properties of single-walled carbon nanotubes (SWNTs) are sensitive to the gas molecules adsorbed on nanotube sidewalls. It is imperative to investigate the interaction between SWNTs and gas molecules in order to understand the mechanism of SWNT-based gas-sensing devices or the stability of individual SWNT-based field effect transistors (FETs). To avoid the Schottky barrier at the metal/SWNT contact, which dominates the performance of SWNT-based FETs, we utilize a contactless technique, dielectric force microscopy (DFM), to study the intrinsic interaction between SWNTs and gaseous ammonia molecules. Results show that gaseous ammonia affects the conductivity of semiconducting SWNTs but not metallic SWNTs. Semiconducting SWNTs, which are p-type doped in air, show suppressed hole concentration in ammonia gas and are even inverted to n-type doping in some cases.

收录类别SCI
语种英语
WOS记录号WOS:000312170600019
公开日期2013-01-27
内容类型期刊论文
源URL[http://58.210.77.100/handle/332007/1126]  
专题苏州纳米技术与纳米仿生研究所_纳米研究国际实验室_陈立桅团队
苏州纳米技术与纳米仿生研究所_纳米研究国际实验室_张珽团队
通讯作者Liwei Chen(陈立桅); Liwei Chen(陈立桅)
推荐引用方式
GB/T 7714
Di Lu,Liwei Chen,Ting Zhang,et al. Probing Electronic Doping of Single-Walled Carbon Nanotubes by Gaseous Ammonia with Dielectric Force Microscopy[J]. The Journal of Physical letters,2012,3(23):3509-3512.
APA Di Lu,Liwei Chen,Ting Zhang,Wei Lu,&Liwei Chen.(2012).Probing Electronic Doping of Single-Walled Carbon Nanotubes by Gaseous Ammonia with Dielectric Force Microscopy.The Journal of Physical letters,3(23),3509-3512.
MLA Di Lu,et al."Probing Electronic Doping of Single-Walled Carbon Nanotubes by Gaseous Ammonia with Dielectric Force Microscopy".The Journal of Physical letters 3.23(2012):3509-3512.
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