Extended depth of focus for transmission x-ray microscope

	Extended depth of focus for transmission x-ray microscope
	Liu, YJ; Wang, JY; Hong YL(洪友丽); Hong, YL; Wang, ZL; Zhang, K; Williams, PA; Zhu, PP; Andrews, JC; Pianetta, P
刊名	OPTICS LETTERS
	2012
卷号	37 期号:17 页码:3708-3710
英文摘要	A fast discrete curvelet transform based focus-stacking algorithm for extending the depth of focus of a transmission x-ray microscope (TXM) is presented. By analyzing an image stack of a sample taken in a Z-scan, a fully in-focus image can be generated by the proposed scheme. With the extended depth of focus, it is possible to obtain 3D structural information over a large volume at nanometer resolution. The focus-stacking method has been demonstrated using a dataset taken with a laboratory x-ray source based TXM system. The possibility and limitations of generalizing this method to a synchrotron based TXM are also discussed. We expect the proposed method to be of important impact in 3D x-ray microscopy. (c) 2012 Optical Society of America
学科主题	Optics
收录类别	SCI
WOS记录号	WOS:000308595300078
公开日期	2016-05-03
内容类型	期刊论文
源URL	[http://ir.ihep.ac.cn/handle/311005/224238]
专题	中国科学院高能物理研究所
推荐引用方式 GB/T 7714	Liu, YJ,Wang, JY,Hong YL,et al. Extended depth of focus for transmission x-ray microscope[J]. OPTICS LETTERS,2012,37(17):3708-3710.
APA	Liu, YJ.,Wang, JY.,洪友丽.,Hong, YL.,Wang, ZL.,...&吴自玉.(2012).Extended depth of focus for transmission x-ray microscope.OPTICS LETTERS,37(17),3708-3710.
MLA	Liu, YJ,et al."Extended depth of focus for transmission x-ray microscope".OPTICS LETTERS 37.17(2012):3708-3710.