Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy

	Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy
	H.L. Gao ; X.W. Zhang ; J.H. Meng ; Z.G. Yin ; L.Q. Zhang ; J.L. Wu ; X. Liu
刊名	thin solid films
	2015
卷号	576 页码:81-87
学科主题	半导体材料
收录类别	SCI
语种	英语
公开日期	2016-03-23
内容类型	期刊论文
源URL	[http://ir.semi.ac.cn/handle/172111/26809]
专题	半导体研究所_中科院半导体材料科学重点实验室
推荐引用方式 GB/T 7714	H.L. Gao,X.W. Zhang,J.H. Meng,et al. Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy[J]. thin solid films,2015,576:81-87.
APA	H.L. Gao.,X.W. Zhang.,J.H. Meng.,Z.G. Yin.,L.Q. Zhang.,...&X. Liu.(2015).Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy.thin solid films,576,81-87.
MLA	H.L. Gao,et al."Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy".thin solid films 576(2015):81-87.