MBE Growth of High Electron Mobility InP Epilayers | |
Xu Bo | |
刊名 | 半导体学报 |
2005 | |
卷号 | 26期号:8页码:1485-1488 |
中文摘要 | the molecular beam epitaxial growth of high quality epilayers on (100) inp substrate using a valve phosphorous cracker cell over a wide range of p/in bep ratio (2.0-7.0) and growth rate (0.437 and 0. 791μm/h). experimental results show that electrical properties exhibit a pronounced dependence on growth parameters,which are growth rate, p/in bep ratio, cracker zone temperature, and growth temperature. the parameters have been optimized carefully via the results of hall measurements. for a typical sample, 77k electron mobility of 4.57 × 10^4 cm^2/(v · s) and electron concentration of 1.55×10^15 cm^-3 have been achieved with an epilayer thickness of 2.35μm at a growth temperature of 370℃ by using a cracking zone temperature of 850℃. |
英文摘要 | the molecular beam epitaxial growth of high quality epilayers on (100) inp substrate using a valve phosphorous cracker cell over a wide range of p/in bep ratio (2.0-7.0) and growth rate (0.437 and 0. 791μm/h). experimental results show that electrical properties exhibit a pronounced dependence on growth parameters,which are growth rate, p/in bep ratio, cracker zone temperature, and growth temperature. the parameters have been optimized carefully via the results of hall measurements. for a typical sample, 77k electron mobility of 4.57 × 10^4 cm^2/(v · s) and electron concentration of 1.55×10^15 cm^-3 have been achieved with an epilayer thickness of 2.35μm at a growth temperature of 370℃ by using a cracking zone temperature of 850℃.; 于2010-11-23批量导入; zhangdi于2010-11-23 13:04:17导入数据到semi-ir的ir; made available in dspace on 2010-11-23t05:04:17z (gmt). no. of bitstreams: 1 4437.pdf: 222839 bytes, checksum: b1111e009366285a19229a87535bc3fe (md5) previous issue date: 2005; 国家自然科学基金资助项目; nankai university;中科院半导体所 |
学科主题 | 半导体材料 |
收录类别 | CSCD |
资助信息 | 国家自然科学基金资助项目 |
语种 | 英语 |
公开日期 | 2010-11-23 ; 2011-04-29 |
内容类型 | 期刊论文 |
源URL | [http://ir.semi.ac.cn/handle/172111/16929] |
专题 | 半导体研究所_中国科学院半导体研究所(2009年前) |
推荐引用方式 GB/T 7714 | Xu Bo. MBE Growth of High Electron Mobility InP Epilayers[J]. 半导体学报,2005,26(8):1485-1488. |
APA | Xu Bo.(2005).MBE Growth of High Electron Mobility InP Epilayers.半导体学报,26(8),1485-1488. |
MLA | Xu Bo."MBE Growth of High Electron Mobility InP Epilayers".半导体学报 26.8(2005):1485-1488. |
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