Experimental study on three-dimensional ptychography for thick sample

CORC > 西安光学精密机械研究所 > 中国科学院西安光学精密机械研究所 > 瞬态光学技术国家重点实验室

	Experimental study on three-dimensional ptychography for thick sample
	Pan An 1,3; Zhang Xiao-Fei 2,3; Wang Bin 2,3; Zhao Qing 1,3; Shi Yi-Shi 3,4
刊名	acta physica sinica
	2016-01-05
卷号	65 期号:1 页码:014204
关键词	thick samples three-dimensional ptychography iterative engine multi-wavelength
ISSN号	1000-3290
其他题名	厚样品三维叠层衍射成像的实验研究
通讯作者	shi, yi-shi (sysopt@126.com)
产权排序	1
英文摘要	ptychography is a new kind of lens-less imaging technology. what restricts the technique is the assumption of a multiplicative interaction between the illuminating coherent beam and the specimen, and the ptychography cannot be applied to samples thicker than a few tens of micrometers in the case of visible-light imaging at micron-scale resolution. in the present work, we split a sample into axial sections, thereby realize three-dimensional ptychographic imaging of thick samples at the millimeter level in a series of computer simulations and optical experiments. our simulation results reveal that by using single wavelength we cannot achieve good-quality images of thick samples. thus it is necessary to introduce more wavelengths for illumination. with increasing the number of wavelengths, the imaging quality of three-dimensional thick samples can be enhanced continually. then we make further study on the relationship between the imaging quality and the magnitude of wavelength in optical experiments by using two groups of samples with different thickness values. the results demonstrate that our experimental results are highly consistent with simulations. for our concrete configuration in this paper, the best results of imaging and separation may be obtained for the case of tri-wavelength. at the same time we make a reasonable explanation for the phenomenon of fold-over in the experiment. our results are important and meaningful for the practical utilizing of three-dimensional ptychography of thick samples.
学科主题	数理科学和化学
WOS标题词	science & technology ; physical sciences
类目[WOS]	physics, multidisciplinary
研究领域[WOS]	physics
关键词[WOS]	microscopy ; resolution
收录类别	SCI ; EI
语种	中文
WOS记录号	WOS:000370940200011
内容类型	期刊论文
源URL	[http://ir.opt.ac.cn/handle/181661/27810]
专题	西安光学精密机械研究所_瞬态光学技术国家重点实验室
作者单位	1.Chinese Acad Sci, Xian Inst Opt & Precis Mech, Xian 710119, Peoples R China 2.Chinese Acad Sci, Changchun Inst Opt Fine Mech & Phys, Changchun 130033, Peoples R China 3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 4.Chinese Acad Sci, Acad Optoelect, Beijing 100094, Peoples R China
推荐引用方式 GB/T 7714	Pan An,Zhang Xiao-Fei,Wang Bin,et al. Experimental study on three-dimensional ptychography for thick sample[J]. acta physica sinica,2016,65(1):014204.
APA	Pan An,Zhang Xiao-Fei,Wang Bin,Zhao Qing,&Shi Yi-Shi.(2016).Experimental study on three-dimensional ptychography for thick sample.acta physica sinica,65(1),014204.
MLA	Pan An,et al."Experimental study on three-dimensional ptychography for thick sample".acta physica sinica 65.1(2016):014204.